Measure hysteresis M(H) loops, torque curves, and temperature dependent magnetic properties of a wide range of samples including bulk, powder, thin film, fluid, and magnetic structures.
Micro-manipulated probe stations used for non-destructive testing of devices on full and partial wafers. Ideal for measuring magneto-transport, electrical, electro-optical, parametric, high Z, DC, RF, and microwave properties.
Measure AC/DC Hall effect and AHE in spintronics, transparent oxides, DMS, and compound semiconductors. Resolve individual carrier mobilities and densities using our QMSA software package.
The EM-V Series electromagnets produce variable magnetic fields with a variety of air gap and pole cap configurations. They are ideal for a variety of applications.
Linear bipolar DC magnet power supplies provide true 4-quadrant output, eliminating the need for external switching or operator intervention to reverse current polarity.