Cryogenic Probe Stations

Micro-manipulated probe stations used for non-destructive testing of devices on full and partial wafers. Ideal for measuring magneto-transport, electrical, electro-optical, parametric, high Z, DC, RF, and microwave properties. More information...

Lake Shore cryogenic probe stations

  Magnet field Maximum probe arms Standard temperature range Optional high temperature Optional low temperature Maximum sample size Vacuum Sample stage rotation
Cryogen-Free Cryogenic Probe Stations
CRX-EM-HF 0.6 T horizontal field electromagnet 4 8 K to 400 K 20 K to 675 K 25 mm (1 in) diameter 10-5 torr ±360° (optional)
CRX-VF 2.5 T vertical field superconducting magnet 6 10 K to 500 K, <10 K to 400 K with load lock 51 mm (2 in) diameter 10-5 torr standard,
10-7 torr optional
CRX-4K 6 4.5 K to 350 K 20 K to 675 K 51 mm (2 in) diameter 10-5 torr
CRX-6.5K 6 <10 K to 350 K 20 K to 675 K 51 mm (2 in) diameter 10-5 torr
Cryogenic Probe Stations
FWPX 6 4.5 K to 475 K 3.5 K 102 mm (4 in) diameter 10-5 torr ±5°
EMPX-H2 0.6 T horizontal field electromagnet 4 4.5 K to 400 K;
8 K to 400 K with 360° rotation option
20 K to 675 K 3.2 K 25 mm (1 in) diameter 10-5 torr ±360° (optional)
CPX-HF 1 T horizontal field superconducting magnet 4 4.2 K to 400 K 2 K 25 mm (1 in) diameter 10-5 torr standard, 10-7 torr optional ±5°
CPX-VF 2.5 T vertical field superconducting magnet 6 4.2 K to 400 K, <10 K to 400 K with load lock 2 K 51 mm (2 in) diameter 10-5 torr standard, 10-7 torr optional ±5°
CPX 6 4.2 K to 475 K, <10 K to 400 K with load lock 20 K to 675 K Cannot be used with load-lock sample assembly Low temp: 1.9 K, Very low temp: 1.6 K 51 mm (2 in) diameter 10-5 torr standard, 10-7 torr optional ±5°
TTPX 6 4.2 K to 475 K 20 K to 675 K 3.2 K 51 mm (2 in) diameter 10-5 torr
PS-100 4 4.2 K to 475 K 20 K to 675 K 3.2 K 32 mm (1.25 in) diameter 10-5 torr
CRX-EM-HF EMPX-H2 CPX-HF CRX-VF CPX-VF CPX CRX-4K CRX-6.5K PS-100 TTPX FWPX

There are no products matching the selection.